FAS Research Computing - Scratch under high load – 사건 세부 정보
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Scratch under high load
해결됨
정상
시작 약 2년 전4월 30, 2024지속됨 약 1시간13:3514:32UTC
업데이트
해결됨
UTC
해결됨
UTC
The high I/O job has been identified. Scratch is back to normal operaiton.
조사 중
UTC
조사 중
UTC
Scratch performance is degraded.
holyscratch01 is under abnormally high I/O load.
We are working to determine which job is the cause.