FAS Research Computing - Scratch under high load – Häiriön yksityiskohdat
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Status page for the Harvard FAS Research Computing cluster and other resources.
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Scratch under high load
Ratkaistu
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Alkoi noin 2 vuotta sittenKesti noin tunti
Päivitykset
Ratkaistu
Ratkaistu
The high I/O job has been identified. Scratch is back to normal operaiton.
Tutkitaan
Tutkitaan
Scratch performance is degraded.
holyscratch01 is under abnormally high I/O load.
We are working to determine which job is the cause.