FAS Research Computing - Scratch under high load – Incident details

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Scratch under high load

Resolved
Operational
Started 11 months agoLasted about 1 hour
Updates
  • Resolved
    Resolved

    The high I/O job has been identified. Scratch is back to normal operaiton.

  • Investigating
    Investigating

    Scratch performance is degraded.

    holyscratch01 is under abnormally high I/O load.

    We are working to determine which job is the cause.

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https://portal.rc.fas.harvard.edu or email rchelp@rc.fas.harvard.edu