FAS Research Computing - Scratch under high load – Details zu Vorfällen
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Scratch under high load
Gelöst
Funktionsfähig
Aufgetreten am vor etwa 2 JahrenDauerte etwa 1 Stunde
Aktualisierung
Gelöst
Gelöst
The high I/O job has been identified. Scratch is back to normal operaiton.
Analyse
Analyse
Scratch performance is degraded.
holyscratch01 is under abnormally high I/O load.
We are working to determine which job is the cause.